Spis treści

X-Ray-Diffraction
Computer Simulation in: X-ray diffraction of multilayers

Ray-Diffraction

Optics:

	parallel beam optics (for thin film measurement)
	Bragg-Brentano para-focusing optics
	fixed point focus optics (texture measurement)

Sample attachment:

	multi purpouse sample stage
	Eulerian open cradle (j,y,z)

Detectors:

	proportional detector PW 1711
	proportional detectors PW3011
	position sensitive Si strip detector

Computer Simulation in: X-ray diffraction of multilayers

Programs : Wingixa, Profile Fit, SlerfWin.

Wingixa

Reflectivity Ni80Fe20/Au 

Profile Fit

SlerfWin - analysing program for multilayers diffraction

Model

Information directly available from the q-2q-scan which characterizes the superlattice structure:
· the multilayer period (1):

· the average interplanar distance (2):

where qm, qn and q0 are positions of m-th, n-th, and central superlattice peak, respectively. Taking into account that (3):

we can determine the average number of monolayers of both multilayer constituents as (4):

           

From the Eqs.(1- 4) we can see that for each part of the interplanar distances dA and dB the average numbers of the monolayers nA and mB are exactly determined. SlerfWin program looks for the best fit of the calculated (Ical) and the experimental (Iexp) profiles while the interplanar distances dA and dB are changed. The corresponding numbers of the monolayers are consequently recalculated according to Eq.(4).
The fitting factor is (5):

The results of the fitting procedures were obtained assuming some intermixing of Au or Cu spacers
and Ni80Fe20 interfaces (or short range roughness).

Department of Electronics
AGH-University of Science and Technology